Description: Electron Microscopy and Analysis by Goodhew, Peter J.; Humphreys, John; Beanland, Richard Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less
Price: 14.66 USD
Location: Aurora, Illinois
End Time: 2024-08-13T12:07:12.000Z
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Return shipping will be paid by: Seller
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
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Binding: Paperback
Weight: 1 lbs
Product Group: Book
IsTextBook: No
Number of Pages: 264 Pages
Language: English
Publication Name: Electron Microscopy and Analysis
Publisher: CRC Press LLC
Subject: Lasers & Photonics, Materials Science / General, Electron Microscopes & Microscopy, Imaging Systems
Publication Year: 2000
Item Height: 0.6 in
Item Weight: 13.6 Oz
Type: Textbook
Subject Area: Technology & Engineering, Science
Author: Peter J. Goodhew, Richard Beanland, John Humphreys
Item Length: 9.3 in
Item Width: 6.2 in
Format: Uk-B Format Paperback
